Trap-state mapping to model GaN transistors dynamic performance
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Full article: Charge carrier dynamics in 2D materials probed by ultrafast THzspectroscopy
PDF) Trap-state mapping to model GaN transistors dynamic performance
On large-signal modeling of GaN HEMTs: past, development and future - ScienceDirect
Trapping phenomena and degradation mechanisms in GaN-based power HEMTs - ScienceDirect
Method of evaluating interface traps in Al2O3/AlGaN/ GaN high electron mobility transistors
TCAD simulated probability of ionization (Ft,A,j) with the traps
On large-signal modeling of GaN HEMTs: past, development and future - ScienceDirect
Identification of Star Defects in Gallium Nitride with HREBSD and ECCI, Microscopy and Microanalysis
PDF] GaN-HEMT dynamic ON-state resistance characterisation and modelling
Review of dynamic effects and reliability of depletion and enhancement GaN HEMTs for power switching applications - De Santi - 2018 - IET Power Electronics - Wiley Online Library
